--- /dev/null	Thu Jan 01 00:00:00 1970 +0000
+++ b/kerneltest/e32test/usbho/t_otgdi/inc/testcase0468.h	Thu Dec 17 09:24:54 2009 +0200
@@ -0,0 +1,96 @@
+// Copyright (c) 2007-2009 Nokia Corporation and/or its subsidiary(-ies).
+// All rights reserved.
+// This component and the accompanying materials are made available
+// under the terms of the License "Eclipse Public License v1.0"
+// which accompanies this distribution, and is available
+// at the URL "http://www.eclipse.org/legal/epl-v10.html".
+//
+// Initial Contributors:
+// Nokia Corporation - initial contribution.
+//
+// Contributors:
+//
+// Description:
+// @internalComponent
+// 
+//
+
+#ifndef TESTCASE0468_H
+#define TESTCASE0468_H
+
+
+	
+//----------------------------------------------------------------------------------------------		
+//! @SYMTestCaseID				PBASE-T_OTGDI-0468
+//! @SYMTestCaseDesc			Alternative ID_PIN detection API.
+//! @SYMFssID 
+//! @SYMPREQ					1782
+//! @SYMREQ						7080
+//! @SYMTestType				UT
+//! @SYMTestPriority			1 
+//! @SYMTestActions 			1.	Drive VBus BusRequest()
+//!                             2.	Register for VBus notification method QueueOtgVbusNotification() Delay at least 200ms
+//!                             3.	Wait 1 second max for VBus HIGH event
+//!                             4.	Drop VBus BusDrop()
+//!                             5.	Register for VBus notification method QueueOtgVbusNotification()
+//!                             6.	Wait 1 second max for VBus LOW event
+//!                             7.	Repeat steps 1 through 6, 3 times over
+//! @SYMTestExpectedResults 	Between steps 2 and 3, we expect to see an HIGH vbus fire,
+//! 							Between steps 5,6 we expect another LOW vbus event. Fail the test 
+//!                             if event does not arrive in the 200milli -second time
+//----------------------------------------------------------------------------------------------	
+
+	class CTestCase0468 : public CTestCaseRoot
+	{
+public:
+	static CTestCase0468* NewL(TBool aHost);
+	virtual ~CTestCase0468(); 	
+	
+	virtual void ExecuteTestCaseL();
+	void DoCancel();
+	static void CancelKB(CTestCaseRoot *pThis);
+	
+	void RunStepL();
+	virtual void DescribePreconditions();
+	TInt GetStepIndex()	{ return(iCaseStep); };
+
+	static void CancelNotify(CTestCaseRoot *pThis);	
+	
+private:
+	CTestCase0468(TBool aHost);
+	void ConstructL();
+
+
+	// DATA
+private:		
+
+	TInt iRepeats;		// loop counter, 
+
+
+	enum TCaseSteps
+		{
+		EPreconditions,
+		ELoadLdd,		// load 
+		EDetectAPlug,	// double-check before starting
+		ELoopControl,	// loop: loop control  =3x3 times (wait 50ms)
+		ELoopDriveVBus,	// loop: drive
+		ELoopVerifyVBus,// loop: check
+		ELoopWait,      // loop: wait (50ms)
+		ELoopDropVBus,  // loop: drop
+		ELoopVerifyDrop,// loop: test Vbus dropped, and repeat ELoopDriveVBus
+		EUnloadLdd,		// unload 
+		ELastStep
+		};
+	
+		
+	TCaseSteps iCaseStep;
+	
+	const static TTestCaseFactoryReceipt<CTestCase0468> iFactoryReceipt;
+	
+	CTestCaseWatchdog *iWDTimer;	
+
+	void ContinueAfter(TTimeIntervalMicroSeconds32 aMicroSecs, TCaseSteps step);
+	};
+	
+	
+#endif // TESTCASE0468_H