--- /dev/null	Thu Jan 01 00:00:00 1970 +0000
+++ b/kerneltest/e32test/usbho/t_otgdi/inc/testcase1233.h	Thu Dec 17 09:24:54 2009 +0200
@@ -0,0 +1,120 @@
+// Copyright (c) 2007-2009 Nokia Corporation and/or its subsidiary(-ies).
+// All rights reserved.
+// This component and the accompanying materials are made available
+// under the terms of the License "Eclipse Public License v1.0"
+// which accompanies this distribution, and is available
+// at the URL "http://www.eclipse.org/legal/epl-v10.html".
+//
+// Initial Contributors:
+// Nokia Corporation - initial contribution.
+//
+// Contributors:
+//
+// Description:
+// @internalComponent
+// 
+//
+
+#ifndef TESTCASE1233_H
+#define TESTCASE1233_H
+
+	
+//----------------------------------------------------------------------------------------------		
+//! @SYMTestCaseID				PBASE-T_OTGDI-1233
+//! @SYMTestCaseDesc			Exercise all VID/PID pairs for High-Speed Electrical Test
+//! @SYMFssID 
+//! @SYMPREQ					
+//! @SYMREQ						
+//! @SYMTestType				UT
+//! @SYMTestPriority			1 
+//! @SYMTestActions 			This test utilises the USB HOST/OTG stack which handles the 
+//!								Host side of detection of a Device attachment where the Device  
+//!								exposes itself as one of the USB High-Speed test device pairs of  
+//!								VID/PID. 
+//!								 
+//!								The applicable VID/PID pairs are shown on the Host end by logging,  
+//!								and the end result is confirmed by user interaction with the T_OTGDI  
+//!								program. 
+//!								 
+//!								The program runs as a back-to-back H4 pair: 
+//!								 
+//!								t_otgdi /slave      is used on the 'A' connected default-Host side 
+//!								t_otgdi /master  is used on the 'B' connected default-Peripheral side 
+//!								 
+//!								To activate this test, select the menu item that access test  
+//!								PBASE-USB_T_OTGDI-1233 (at 24/10/2008 this was selector 26) 
+//!								 
+//!								The VID/PID pairs are as defined in the OTG Supplement (v1.3)  
+//!								section 6.6.6.1 (table 6-5) and are: 
+//!								 
+//!								0x1A0A/0x0101 
+//!								0x1A0A/0x0102 
+//!								0x1A0A/0x0103 
+//!								0x1A0A/0x0104 
+//!								0x1A0A/0x0105 
+//!								0x1A0A/0x0106 
+//!								0x1A0A/0x0107 
+//!								0x1A0A/0x0108 
+//!								 
+//!								NB: since this runs on an H4, which does not provide High-Speed support,  
+//!								the linkage down to hardware is not implemented: instead, the test  
+//!								relies on recording the appropriate test routing.
+//!
+//! @SYMTestExpectedResults 	
+//! @SYMTestStatus              Defined	
+//----------------------------------------------------------------------------------------------	
+
+
+	class CTestCase1233 : public CTestCaseB2BRoot
+	{
+public:
+	static CTestCase1233* NewL(TBool aHost);
+	virtual ~CTestCase1233(); 	
+	
+	virtual void ExecuteTestCaseL();
+	void DoCancel();
+	static void CancelKB(CTestCaseRoot *pThis);
+	
+	void RunStepL();
+	
+	TInt GetStepIndex()	{ return(iCaseStep); };	
+	
+private:
+	CTestCase1233(TBool aHost);
+	void ConstructL();
+
+	// DATA
+
+private:		
+
+	enum TCaseSteps
+		{
+		// Fixed steps
+		EPreconditions,
+		ELoadLdd,
+
+		// Steps for this test case only
+		ELoopToNextPID,
+		
+		ERaiseVBus,
+		EVBusRaised,
+		
+		EDropVBus,
+		EVBusDropped,
+				
+		// Fixed steps
+		EUnloadLdd,
+		ELastStep
+		};
+	
+	TCaseSteps iCaseStep;
+
+	TInt	   iTestVID;
+	TInt	   iTestPID;
+
+	const static TTestCaseFactoryReceipt<CTestCase1233> iFactoryReceipt;
+	};
+	
+	
+#endif // TESTCASE1233_H
+