kerneltest/e32test/dll/t_import_ldd.cpp
changeset 0 a41df078684a
--- /dev/null	Thu Jan 01 00:00:00 1970 +0000
+++ b/kerneltest/e32test/dll/t_import_ldd.cpp	Mon Oct 19 15:55:17 2009 +0100
@@ -0,0 +1,61 @@
+// Copyright (c) 2006-2009 Nokia Corporation and/or its subsidiary(-ies).
+// All rights reserved.
+// This component and the accompanying materials are made available
+// under the terms of the License "Eclipse Public License v1.0"
+// which accompanies this distribution, and is available
+// at the URL "http://www.eclipse.org/legal/epl-v10.html".
+//
+// Initial Contributors:
+// Nokia Corporation - initial contribution.
+//
+// Contributors:
+//
+// Description:
+// \f32test\loader\t_import_ldd.cpp
+// 
+//
+
+#define __E32TEST_EXTENSION__
+
+#include <e32test.h>
+#include "d_export.h"
+#include "d_import.h"
+
+static RTest test(_L("t_import_ldd"));
+
+
+TInt E32Main()
+	{
+	test.Title();
+	test.Start(_L("Testing ldd importing"));
+	
+	test.Next(_L("Load the exporting ldd"));
+	TInt r=User::LoadLogicalDevice(KExportTestLddName);
+	test_Equal(KErrNone, r);	// Don't allow KErrAlreadyExists as don't want ldd to be XIP.
+
+	RExportLdd exportLdd;
+	test_KErrNone(exportLdd.Open());
+	// The exported function multiplies the 2 arguments.
+	test_Equal(12, exportLdd.RunExport(3, 4));
+	
+	test.Next(_L("Load the importing ldd"));
+	r=User::LoadLogicalDevice(KImportTestLddName);
+	test_Equal(KErrNone, r);	// Don't allow KErrAlreadyExists as don't want ldd to be XIP.
+
+
+	RImportLdd importLdd;
+	test_KErrNone(importLdd.Open());
+	// The imported function multiplies the 2 arguments.
+	test_Equal(12, importLdd.RunImport(3, 4));
+	
+	exportLdd.Close();
+	importLdd.Close();
+
+	test_KErrNone(User::FreeLogicalDevice(KExportTestLddName));
+	test_KErrNone(User::FreeLogicalDevice(KImportTestLddName));
+
+	test.End();
+	return KErrNone;
+    }
+
+