--- /dev/null	Thu Jan 01 00:00:00 1970 +0000
+++ b/kerneltest/e32test/hcr/d_hcrut.h	Mon Oct 19 15:55:17 2009 +0100
@@ -0,0 +1,97 @@
+// Copyright (c) 2008-2009 Nokia Corporation and/or its subsidiary(-ies).
+// All rights reserved.
+// This component and the accompanying materials are made available
+// under the terms of the License "Eclipse Public License v1.0"
+// which accompanies this distribution, and is available
+// at the URL "http://www.eclipse.org/legal/epl-v10.html".
+//
+// Initial Contributors:
+// Nokia Corporation - initial contribution.
+//
+// Contributors:
+//
+// Description:
+// Hardware Configuration Respoitory Tests
+//
+
+#ifndef D_HCR_H
+#define D_HCR_H
+
+#include <e32cmn.h>
+#include <e32ver.h>
+#include <drivers/hcr.h>
+
+#ifndef __KERNEL_MODE__
+#include <e32std.h>
+#endif
+
+
+/**
+Interface to the fast-trace memory buffer.
+*/
+class RHcrTest : public RBusLogicalChannel
+	{
+public:
+		
+#ifndef __KERNEL_MODE__
+	inline TInt Open()
+		{
+		return DoCreate(Name(),TVersion(0,1,1),KNullUnit,NULL,NULL,EOwnerThread);
+		}
+
+	inline TUint Test_SanityTestWordSettings()
+		{
+		return DoControl(ECtrlSanityTestWordSettings);
+		}
+
+	inline TUint Test_SanityTestLargeSettings()
+		{
+		return DoControl(ECtrlSanityTestLargeSettings);
+		}
+
+	inline TUint Test_ReleaseSDRs()
+		{
+		return DoControl(ECtrlFreePhyscialRam);
+		}
+		
+	inline TUint Test_SwitchRepository()
+		{
+		return DoControl(ECtrlSwitchRepository);
+		}
+		
+
+#endif
+
+	inline static const TDesC& Name();
+
+private:
+	enum TControl
+		{
+		ECtrlUndefined = 0,
+		
+		ECtrlSanityTestWordSettings,
+		ECtrlSanityTestLargeSettings,
+		
+		ECtrlGetWordSetting,
+		ECtrlGetLargeSetting,
+		ECtrlGetManyWordSettings,
+		ECtrlGetManyLargeSettings,
+		
+		ECtrlSwitchRepository,
+		
+		ECtrlFreePhyscialRam
+		};
+		
+	friend class DHcrTestChannel;
+	friend class DHcrTestFactory;
+	};
+
+inline const TDesC& RHcrTest::Name()
+	{
+	_LIT(KTestDriver,"d_hcr");
+	return KTestDriver;
+	}
+
+
+
+#endif // D_HCR_H