--- /dev/null	Thu Jan 01 00:00:00 1970 +0000
+++ b/kerneltest/e32utils/nistsecurerng/include/defs.h	Tue Aug 31 16:34:26 2010 +0300
@@ -0,0 +1,92 @@
+/*
+* Portions Copyright (c) 2009 Nokia Corporation and/or its subsidiary(-ies).
+* All rights reserved.
+* This component and the accompanying materials are made available
+* under the terms of "Eclipse Public License v1.0"
+* which accompanies this distribution, and is available
+* at the URL "http://www.eclipse.org/legal/epl-v10.html".
+*
+* Initial Contributors:
+* Nokia Corporation - initial contribution.
+*
+* Contributors:
+*
+* Description: 
+* The original NIST Statistical Test Suite code is placed in public domain.
+* (http://csrc.nist.gov/groups/ST/toolkit/rng/documentation_software.html) 
+* 
+* This software was developed at the National Institute of Standards and Technology by 
+* employees of the Federal Government in the course of their official duties. Pursuant
+* to title 17 Section 105 of the United States Code this software is not subject to 
+* copyright protection and is in the public domain. The NIST Statistical Test Suite is
+* an experimental system. NIST assumes no responsibility whatsoever for its use by other 
+* parties, and makes no guarantees, expressed or implied, about its quality, reliability, 
+* or any other characteristic. We would appreciate acknowledgment if the software is used.
+*/
+
+/* * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * *
+                       D E B U G G I N G  A I D E S
+ * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * */
+#ifndef _DEFS_H_
+#define _DEFS_H_
+
+#include "config.h"
+
+/* * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * *
+                              M A C R O S
+ * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * */
+
+#define MAX(x,y)             ((x) <  (y)  ? (y)  : (x))
+#define MIN(x,y)             ((x) >  (y)  ? (y)  : (x))
+#define isNonPositive(x)     ((x) <= 0.e0 ?   1  : 0)
+#define isPositive(x)        ((x) >  0.e0 ?   1 : 0)
+#define isNegative(x)        ((x) <  0.e0 ?   1 : 0)
+#define isGreaterThanOne(x)  ((x) >  1.e0 ?   1 : 0)
+#define isZero(x)            ((x) == 0.e0 ?   1 : 0)
+#define isOne(x)             ((x) == 1.e0 ?   1 : 0)
+
+/* * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * 
+                         G L O B A L  C O N S T A N T S
+ * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * */
+
+#define ALPHA							0.01	/* SIGNIFICANCE LEVEL */
+#define MAXNUMOFTEMPLATES				148		/* APERIODIC TEMPLATES: 148=>temp_length=9 */
+#define NUMOFTESTS						15		/* MAX TESTS DEFINED  */
+#define NUMOFGENERATORS					11		/* MAX PRNGs */
+#define MAXFILESPERMITTEDFORPARTITION	148
+#define	TEST_FREQUENCY					1
+#define	TEST_BLOCK_FREQUENCY			2
+#define	TEST_CUSUM						3
+#define	TEST_RUNS						4
+#define	TEST_LONGEST_RUN				5
+#define	TEST_RANK						6
+#define	TEST_FFT						7
+#define	TEST_NONPERIODIC				8
+#define	TEST_OVERLAPPING				9
+#define	TEST_UNIVERSAL					10
+#define	TEST_APEN						11
+#define	TEST_RND_EXCURSION				12
+#define	TEST_RND_EXCURSION_VAR			13
+#define	TEST_SERIAL						14
+#define	TEST_LINEARCOMPLEXITY			15
+
+
+/* * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * *
+                   G L O B A L   D A T A  S T R U C T U R E S
+ * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * */
+
+typedef unsigned char	BitSequence;
+
+typedef struct _testParameters {
+	int		n;
+	int		blockFrequencyBlockLength;
+	int		nonOverlappingTemplateBlockLength;
+	int		overlappingTemplateBlockLength;
+	int		serialBlockLength;
+	int		linearComplexitySequenceLength;
+	int		approximateEntropyBlockLength;
+	int		numOfBitStreams;
+} TP;
+
+#endif // _DEFS_H_
+