// Copyright (c) 2005-2009 Nokia Corporation and/or its subsidiary(-ies).
// All rights reserved.
// This component and the accompanying materials are made available
// under the terms of the License "Eclipse Public License v1.0"
// which accompanies this distribution, and is available
// at the URL "http://www.eclipse.org/legal/epl-v10.html".
//
// Initial Contributors:
// Nokia Corporation - initial contribution.
//
// Contributors:
//
// Description:
// f32test/group/t_pagestress.mmp
// 
//

target			t_pagestress.exe
targettype		exe
sourcepath		../demandpaging
source			loader/t_pageldrtstdll.cia t_pagestress.cpp 
library			euser.lib efsrv.lib
capability		all
macro			DEF_T_PAGESTRESS
userinclude		../demandpaging/loader
vendorid		0x70000001
OS_LAYER_SYSTEMINCLUDE_SYMBIAN
userinclude		../demandpaging
userinclude		../../e32test/demandpaging
pagedcode
unpageddata	// todo: otherwise this test's memory use causes it to take a very long time and timeout
SMPSAFE