kerneltest/e32test/misc/t_duid.cpp
author John Imhofe <john.imhofe@nokia.com>
Mon, 21 Dec 2009 16:14:42 +0000
changeset 2 4122176ea935
parent 0 a41df078684a
permissions -rw-r--r--
Revision: 200948 + Removing redundant base integration tests and fixing build errors Kit: 200948

// Copyright (c) 1996-2009 Nokia Corporation and/or its subsidiary(-ies).
// All rights reserved.
// This component and the accompanying materials are made available
// under the terms of the License "Eclipse Public License v1.0"
// which accompanies this distribution, and is available
// at the URL "http://www.eclipse.org/legal/epl-v10.html".
//
// Initial Contributors:
// Nokia Corporation - initial contribution.
//
// Contributors:
//
// Description:
// e32test\misc\t_duid.cpp
// 
//

#include <e32test.h>

EXPORT_C void dummyExport()
	{}