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SUPPORTING SERIES 60 3.0 ->

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Product Description:

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STIF is a test harness for testing Symbian & S60 non-UI components.

This widely used test framework can be used for both test case implementation and test cases execution.

Features :

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- Test module implements test cases

- Error and exception handling

- Concurrent test case execution

- Test Module Template Wizard (createtestmodule.BAT)

- Memory leak detection

- File parsing with STIF Parser

- Logging facilities for test modules with STIF Logger

- Scripted test cases with Test Scripter

- Test case synchronization with STIF Event System

- Test case combining with Test Combiner

- Write once, test everywhere, e.g. test cases made during the development phase can be used in system testing, automatic release testing, etc.

- Easy to use

- Multiple test cases can be executed concurrently.

- All execution errors and exceptions are handled properly and reported to tester.

- Excellent support for test automation.

- Symbian OS 9.1 features supported (Platform Security)

- Releases bi-weekly

- Heap and stack configuring

- OOM test support

- Test Interference support

- S60\Symbian UI component test case implementation support

Enhancements:

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N/A

New Features:

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S60\Symbian UI component test case implementation support 

System Requirements:

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Basic Requirements:

- S60/Symbian OS development environment installed

Compatibility Issues:

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N/A

Known Issues:

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If problems with compilation appears (missing platform_paths.hrh file error message), 

please use EnvPatcher.pl script from stif/envpatcher folder to fix environment. 

Copyright (c) 2009 Nokia Corporation and/or its subsidiary(-ies).

All rights reserved.