--- a/persistentstorage/centralrepository/test/testexecute/performance/inc/TE_DefectTestStep.h	Thu Aug 19 11:36:21 2010 +0300
+++ /dev/null	Thu Jan 01 00:00:00 1970 +0000
@@ -1,38 +0,0 @@
-// Copyright (c) 2005-2009 Nokia Corporation and/or its subsidiary(-ies).
-// All rights reserved.
-// This component and the accompanying materials are made available
-// under the terms of "Eclipse Public License v1.0"
-// which accompanies this distribution, and is available
-// at the URL "http://www.eclipse.org/legal/epl-v10.html".
-//
-// Initial Contributors:
-// Nokia Corporation - initial contribution.
-//
-// Contributors:
-//
-// Description:
-//
- 
-#ifndef __TE_DEFECTTESTSTEP_H__
-#define __TE_DEFECTTESTSTEP_H__
-
-#include <test/testexecutestepbase.h>
-
-_LIT(KPerfTestDefectStepDEF057491, "CentRepDefectTest057491");
-_LIT(KPerfTestDefectStepDEF059633, "CentRepDefectTest059633");
-
-class CPerfTestDefectStep057491 : public CTestStep
-	{
-public:
-	CPerfTestDefectStep057491();
-	virtual TVerdict doTestStepL(void);
-	};
-
-class CPerfTestDefectStep059633 : public CTestStep
-	{
-public:
-	CPerfTestDefectStep059633();
-	virtual TVerdict doTestStepL(void);
-	};
-
-#endif // __TE_DEFECTTESTSTEP_H__