diff -r 000000000000 -r 08ec8eefde2f persistentstorage/centralrepository/test/testexecute/performance/inc/TE_DefectTestStep.h
--- /dev/null	Thu Jan 01 00:00:00 1970 +0000
+++ b/persistentstorage/centralrepository/test/testexecute/performance/inc/TE_DefectTestStep.h	Fri Jan 22 11:06:30 2010 +0200
@@ -0,0 +1,38 @@
+// Copyright (c) 2005-2009 Nokia Corporation and/or its subsidiary(-ies).
+// All rights reserved.
+// This component and the accompanying materials are made available
+// under the terms of "Eclipse Public License v1.0"
+// which accompanies this distribution, and is available
+// at the URL "http://www.eclipse.org/legal/epl-v10.html".
+//
+// Initial Contributors:
+// Nokia Corporation - initial contribution.
+//
+// Contributors:
+//
+// Description:
+//
+ 
+#ifndef __TE_DEFECTTESTSTEP_H__
+#define __TE_DEFECTTESTSTEP_H__
+
+#include <test/testexecutestepbase.h>
+
+_LIT(KPerfTestDefectStepDEF057491, "CentRepDefectTest057491");
+_LIT(KPerfTestDefectStepDEF059633, "CentRepDefectTest059633");
+
+class CPerfTestDefectStep057491 : public CTestStep
+	{
+public:
+	CPerfTestDefectStep057491();
+	virtual TVerdict doTestStepL(void);
+	};
+
+class CPerfTestDefectStep059633 : public CTestStep
+	{
+public:
+	CPerfTestDefectStep059633();
+	virtual TVerdict doTestStepL(void);
+	};
+
+#endif // __TE_DEFECTTESTSTEP_H__