--- /dev/null	Thu Jan 01 00:00:00 1970 +0000
+++ b/usbmgmt/usbmgr/host/fdf/test/t_fdf/testbase.h	Tue Feb 02 02:02:59 2010 +0200
@@ -0,0 +1,57 @@
+/*
+* Copyright (c) 2007-2009 Nokia Corporation and/or its subsidiary(-ies).
+* All rights reserved.
+* This component and the accompanying materials are made available
+* under the terms of "Eclipse Public License v1.0"
+* which accompanies this distribution, and is available
+* at the URL "http://www.eclipse.org/legal/epl-v10.html".
+*
+* Initial Contributors:
+* Nokia Corporation - initial contribution.
+*
+* Contributors:
+*
+* Description:
+*
+*/
+
+#ifndef __TESTBASE_H__
+#define __TESTBASE_H__
+
+#include <e32base.h>
+#include <e32keys.h>
+
+class MTestManager;
+
+#define LeaveIfErrorL(aError) \
+	{ \
+	if ( aError ) \
+		{ \
+		iManager.Write(_L8("LEAVE: line %d, code %d"), __LINE__, aError); \
+		User::Leave(aError); \
+		} \
+	} 
+
+class CTestBase : public CBase
+/**
+ * Abstract base class for tests.
+ */
+	{
+public:
+	CTestBase(MTestManager& aManager);
+	~CTestBase();
+
+public:
+	// Tests may implement either of these to pick up user selections. 
+	// Single-key entries require you to implement the TKeyCode overload; 
+	// multi-key selections require you to implement the descriptor overload.
+	virtual void ProcessKeyL(TKeyCode aKeyCode);
+	virtual void ProcessKeyL(const TDesC8& aString);
+
+	virtual void DisplayTestSpecificMenu() = 0;
+
+protected: // unowned
+	MTestManager& iManager;
+	};
+
+#endif // __TESTBASE_H__