--- /dev/null	Thu Jan 01 00:00:00 1970 +0000
+++ b/localisation/uiftestfw/inc/appfwk_tmsteststep.h	Tue Aug 03 10:20:34 2010 +0100
@@ -0,0 +1,63 @@
+/*
+* Copyright (c) 2008 Nokia Corporation and/or its subsidiary(-ies).
+* All rights reserved.
+* This component and the accompanying materials are made available
+* under the terms of "Eclipse Public License v1.0"
+* which accompanies this distribution, and is available
+* at the URL "http://www.eclipse.org/legal/epl-v10.html".
+*
+* Initial Contributors:
+* Nokia Corporation - initial contribution.
+*
+* Contributors:
+*
+* Description:
+*
+*/
+
+
+/**
+@file
+@test
+@internalComponent
+*/
+
+#ifndef tmsteststep_
+#define tmsteststep_
+
+#include <test/testexecutestepbase.h>
+#include <w32std.h>
+#include <flogger.h>
+#include <badesca.h> 
+
+// default name that a test will be called if not specifically set in the calling object
+_LIT(KUnknownSYMTestCaseIDName, "@SYMTestCaseID Unnamed test");
+_LIT(KUndefinedSYMTestCaseIDName, "@SYMTestCaseID is not defined");
+_LIT(KNotATestSYMTestCaseIDName, "This is not a test");
+
+class CTmsTestStep : public CTestStep
+	{
+public:
+	IMPORT_C CTmsTestStep();
+	IMPORT_C virtual ~CTmsTestStep();
+	IMPORT_C void CloseTMSGraphicsStep();
+	IMPORT_C void MQCTest(TBool aCondition, const TText8* aFile, TInt aLine);
+	IMPORT_C void MQCTestL(TBool aCondition, const TText8* aFile, TInt aLine);
+	IMPORT_C void SetTestStepID(const TDesC& aStepName);
+	IMPORT_C void SetOverallTestStepID(const TDesC& aStepName);
+	IMPORT_C void RecordTestResultL();
+	IMPORT_C void MultipleResultsForSameID(TBool aShowMultipleResults);
+
+	static void DebugLogL(const TDesC8 &aText, const TDesC8 &aText1, TInt aPos);
+	static TInt DebugLogPosL();
+protected:
+	static TInt ReadNextLineL( RFile &aFile, TDes8 &aLine );
+	void CleanUpAndWriteResults();
+	TBuf8<KMaxTestExecuteNameLength> iCurrentTestStepName;
+	TBool iStepPassFail;
+	TBool iShowMultipleResults;
+	CDesCArrayFlat* iTestStepNames;
+	RArray<TInt> iTestStepPositions;
+	};
+
+#endif /*tmsteststep_*/