/*

* Copyright (c) 2007 Nokia Corporation and/or its subsidiary(-ies). 

* All rights reserved.

* This component and the accompanying materials are made available

* under the terms of "Eclipse Public License v1.0"

* which accompanies this distribution, and is available

* at the URL "http://www.eclipse.org/legal/epl-v10.html".

*

* Initial Contributors:

* Nokia Corporation - initial contribution.

*

* Contributors:

*

* Description:  Localization strings for DiagInternalMemoryPlugin.

*

*/

//  LOCALISATION STRINGS

// NEW

//d:Name of internal memory test as it appears in the plug-in list view

//l:list_single_graphic_heading_pane_t1_cp2

//r:3.2

//

#define qtn_diag_lst_internal_memory           "Memory test"

//d:internal media card test text for suite view

//l:list_single_graphic_pane_t1

//w:

//r: 3.2

//

//#define qtn_diag_lst_test_internal_memory    "Test Internal Device Memory" // LVT Test

//d:internal media card test text for starting dialog header

//l:heading_pane_t1

//w:

//r: 3.2

//

#define qtn_diag_msg_title_internal_memory    "Memory test"

//d:internal media card test description

//l:popup_info_list_pane_t1

//w:

//r: 3.2

//

#define qtn_diag_msg_info_internal_memory    "The following test will check device's memory."

//d:internal memory test text for title pane of suite/result view

//l:title_pane_t2/opt12

//w:

//r: 3.2

//

//#define qtn_diag_title_test_internal_memory   "Memory test" // LVT Test

//d:Failed result text

//l:popup_info_list_pane_t1

//r:5.0

//

#define qtn_diag_conf_test_failed_internal_memory "Memory test"

//d:Message text for wait dialog

//l:popup_note_wait_window

//r:3.2

//

#define qtn_diag_msg_testing_internal_memory "Testing memory"

//d:Softkey text.

//l:control_pane_t1/opt7 

//r:5.0

//

#define qtn_diag_softk_skip "Skip"

// End of File