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1 // Copyright (c) 2007-2009 Nokia Corporation and/or its subsidiary(-ies). |
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2 // All rights reserved. |
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3 // This component and the accompanying materials are made available |
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4 // under the terms of the License "Eclipse Public License v1.0" |
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5 // which accompanies this distribution, and is available |
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6 // at the URL "http://www.eclipse.org/legal/epl-v10.html". |
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7 // |
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8 // Initial Contributors: |
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9 // Nokia Corporation - initial contribution. |
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10 // |
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11 // Contributors: |
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12 // |
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13 // Description: |
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14 // @internalComponent |
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15 // |
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16 // |
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17 |
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18 #ifndef TESTCASE1233_H |
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19 #define TESTCASE1233_H |
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20 |
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21 |
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22 //---------------------------------------------------------------------------------------------- |
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23 //! @SYMTestCaseID PBASE-T_OTGDI-1233 |
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24 //! @SYMTestCaseDesc Exercise all VID/PID pairs for High-Speed Electrical Test |
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25 //! @SYMFssID |
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26 //! @SYMPREQ |
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27 //! @SYMREQ |
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28 //! @SYMTestType UT |
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29 //! @SYMTestPriority 1 |
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30 //! @SYMTestActions This test utilises the USB HOST/OTG stack which handles the |
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31 //! Host side of detection of a Device attachment where the Device |
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32 //! exposes itself as one of the USB High-Speed test device pairs of |
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33 //! VID/PID. |
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34 //! |
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35 //! The applicable VID/PID pairs are shown on the Host end by logging, |
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36 //! and the end result is confirmed by user interaction with the T_OTGDI |
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37 //! program. |
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38 //! |
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39 //! The program runs as a back-to-back H4 pair: |
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40 //! |
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41 //! t_otgdi /slave is used on the 'A' connected default-Host side |
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42 //! t_otgdi /master is used on the 'B' connected default-Peripheral side |
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43 //! |
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44 //! To activate this test, select the menu item that access test |
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45 //! PBASE-USB_T_OTGDI-1233 (at 24/10/2008 this was selector 26) |
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46 //! |
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47 //! The VID/PID pairs are as defined in the OTG Supplement (v1.3) |
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48 //! section 6.6.6.1 (table 6-5) and are: |
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49 //! |
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50 //! 0x1A0A/0x0101 |
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51 //! 0x1A0A/0x0102 |
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52 //! 0x1A0A/0x0103 |
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53 //! 0x1A0A/0x0104 |
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54 //! 0x1A0A/0x0105 |
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55 //! 0x1A0A/0x0106 |
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56 //! 0x1A0A/0x0107 |
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57 //! 0x1A0A/0x0108 |
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58 //! |
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59 //! NB: since this runs on an H4, which does not provide High-Speed support, |
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60 //! the linkage down to hardware is not implemented: instead, the test |
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61 //! relies on recording the appropriate test routing. |
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62 //! |
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63 //! @SYMTestExpectedResults |
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64 //! @SYMTestStatus Defined |
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65 //---------------------------------------------------------------------------------------------- |
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66 |
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67 |
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68 class CTestCase1233 : public CTestCaseB2BRoot |
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69 { |
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70 public: |
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71 static CTestCase1233* NewL(TBool aHost); |
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72 virtual ~CTestCase1233(); |
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73 |
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74 virtual void ExecuteTestCaseL(); |
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75 void DoCancel(); |
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76 static void CancelKB(CTestCaseRoot *pThis); |
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77 |
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78 void RunStepL(); |
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79 |
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80 TInt GetStepIndex() { return(iCaseStep); }; |
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81 |
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82 private: |
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83 CTestCase1233(TBool aHost); |
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84 void ConstructL(); |
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85 |
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86 // DATA |
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87 |
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88 private: |
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89 |
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90 enum TCaseSteps |
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91 { |
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92 // Fixed steps |
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93 EPreconditions, |
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94 ELoadLdd, |
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95 |
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96 // Steps for this test case only |
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97 ELoopToNextPID, |
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98 |
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99 ERaiseVBus, |
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100 EVBusRaised, |
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101 |
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102 EDropVBus, |
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103 EVBusDropped, |
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104 |
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105 // Fixed steps |
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106 EUnloadLdd, |
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107 ELastStep |
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108 }; |
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109 |
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110 TCaseSteps iCaseStep; |
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111 |
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112 TInt iTestVID; |
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113 TInt iTestPID; |
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114 |
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115 const static TTestCaseFactoryReceipt<CTestCase1233> iFactoryReceipt; |
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116 }; |
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117 |
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118 |
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119 #endif // TESTCASE1233_H |
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120 |