// Copyright (c) 2007-2009 Nokia Corporation and/or its subsidiary(-ies).

// All rights reserved.

// This component and the accompanying materials are made available

// under the terms of the License "Eclipse Public License v1.0"

// which accompanies this distribution, and is available

// at the URL "http://www.eclipse.org/legal/epl-v10.html".

//

// Initial Contributors:

// Nokia Corporation - initial contribution.

//

// Contributors:

//

// Description:

// @internalComponent

// 

//

#ifndef TESTCASE1233_H

#define TESTCASE1233_H

//----------------------------------------------------------------------------------------------		

//! @SYMTestCaseID				PBASE-T_OTGDI-1233

//! @SYMTestCaseDesc			Exercise all VID/PID pairs for High-Speed Electrical Test

//! @SYMFssID 

//! @SYMPREQ					

//! @SYMREQ						

//! @SYMTestType				UT

//! @SYMTestPriority			1 

//! @SYMTestActions 			This test utilises the USB HOST/OTG stack which handles the 

//!								Host side of detection of a Device attachment where the Device  

//!								exposes itself as one of the USB High-Speed test device pairs of  

//!								VID/PID. 

//!								 

//!								The applicable VID/PID pairs are shown on the Host end by logging,  

//!								and the end result is confirmed by user interaction with the T_OTGDI  

//!								program. 

//!								 

//!								The program runs as a back-to-back H4 pair: 

//!								 

//!								t_otgdi /slave      is used on the 'A' connected default-Host side 

//!								t_otgdi /master  is used on the 'B' connected default-Peripheral side 

//!								 

//!								To activate this test, select the menu item that access test  

//!								PBASE-USB_T_OTGDI-1233 (at 24/10/2008 this was selector 26) 

//!								 

//!								The VID/PID pairs are as defined in the OTG Supplement (v1.3)  

//!								section 6.6.6.1 (table 6-5) and are: 

//!								 

//!								0x1A0A/0x0101 

//!								0x1A0A/0x0102 

//!								0x1A0A/0x0103 

//!								0x1A0A/0x0104 

//!								0x1A0A/0x0105 

//!								0x1A0A/0x0106 

//!								0x1A0A/0x0107 

//!								0x1A0A/0x0108 

//!								 

//!								NB: since this runs on an H4, which does not provide High-Speed support,  

//!								the linkage down to hardware is not implemented: instead, the test  

//!								relies on recording the appropriate test routing.

//!

//! @SYMTestExpectedResults 	

//! @SYMTestStatus              Defined	

//----------------------------------------------------------------------------------------------	

	class CTestCase1233 : public CTestCaseB2BRoot

	{

public:

	static CTestCase1233* NewL(TBool aHost);

	virtual ~CTestCase1233(); 	

	virtual void ExecuteTestCaseL();

	void DoCancel();

	static void CancelKB(CTestCaseRoot *pThis);

	void RunStepL();

	TInt GetStepIndex()	{ return(iCaseStep); };	

private:

	CTestCase1233(TBool aHost);

	void ConstructL();

	// DATA

private:		

	enum TCaseSteps

		{

		// Fixed steps

		EPreconditions,

		ELoadLdd,

		// Steps for this test case only

		ELoopToNextPID,

		ERaiseVBus,

		EVBusRaised,

		EDropVBus,

		EVBusDropped,

		// Fixed steps

		EUnloadLdd,

		ELastStep

		};

	TCaseSteps iCaseStep;

	TInt	   iTestVID;

	TInt	   iTestPID;

	const static TTestCaseFactoryReceipt<CTestCase1233> iFactoryReceipt;

	};

#endif // TESTCASE1233_H