lowlevellibsandfws/pluginfw/TestExecute/EComPerfTest/src/TE_EcomGranularityTestStep.h
// Copyright (c) 2006-2009 Nokia Corporation and/or its subsidiary(-ies).
// All rights reserved.
// This component and the accompanying materials are made available
// under the terms of "Eclipse Public License v1.0"
// which accompanies this distribution, and is available
// at the URL "http://www.eclipse.org/legal/epl-v10.html".
//
// Initial Contributors:
// Nokia Corporation - initial contribution.
//
// Contributors:
//
// Description:
//
/**
@file
@internalComponent
*/
#ifndef TE_ECOMGRANULARITYTESTSTEP_H
#define TE_ECOMGRANULARITYTESTSTEP_H
#include <test/testexecutestepbase.h>
_LIT(KEComImplIndexPerfTest, "EComImplIndexPerfTest");
/**
Teststep to measure ECOM discovery time at critical static stage
at various settings of granularities of ECOM's implementation
RArray.
*/
class CEComImplIndexPerfTest : public CTestStep
{
public:
CEComImplIndexPerfTest();
~CEComImplIndexPerfTest();
TVerdict doTestStepL();
private:
TVerdict ReadConfigParameters();
private:
TInt iMinInfUidIndexGranularity;
TInt iMinIimplUidIndexGranularity;
TInt iMaxInfUidIndexGranularity;
TInt iMaxIimplUidIndexGranularity;
TInt iGranStep;
CActiveScheduler* iScheduler;
RFs iFs;
};
#endif //TE_ECOMGRANULARITYTESTSTEP_H