lowlevellibsandfws/pluginfw/TestExecute/EComPerfTest/src/TE_EcomGranularityTestStep.h
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1 // Copyright (c) 2006-2009 Nokia Corporation and/or its subsidiary(-ies). |
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2 // All rights reserved. |
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3 // This component and the accompanying materials are made available |
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4 // under the terms of "Eclipse Public License v1.0" |
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5 // which accompanies this distribution, and is available |
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6 // at the URL "http://www.eclipse.org/legal/epl-v10.html". |
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7 // |
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8 // Initial Contributors: |
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9 // Nokia Corporation - initial contribution. |
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10 // |
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11 // Contributors: |
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12 // |
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13 // Description: |
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14 // |
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15 |
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16 /** |
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17 @file |
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18 @internalComponent |
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19 */ |
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20 |
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21 #ifndef TE_ECOMGRANULARITYTESTSTEP_H |
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22 #define TE_ECOMGRANULARITYTESTSTEP_H |
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23 |
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24 #include <test/testexecutestepbase.h> |
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25 |
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26 _LIT(KEComImplIndexPerfTest, "EComImplIndexPerfTest"); |
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27 |
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28 /** |
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29 Teststep to measure ECOM discovery time at critical static stage |
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30 at various settings of granularities of ECOM's implementation |
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31 RArray. |
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32 */ |
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33 class CEComImplIndexPerfTest : public CTestStep |
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34 { |
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35 public: |
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36 CEComImplIndexPerfTest(); |
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37 ~CEComImplIndexPerfTest(); |
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38 TVerdict doTestStepL(); |
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39 |
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40 private: |
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41 TVerdict ReadConfigParameters(); |
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42 |
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43 private: |
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44 TInt iMinInfUidIndexGranularity; |
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45 TInt iMinIimplUidIndexGranularity; |
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46 TInt iMaxInfUidIndexGranularity; |
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47 TInt iMaxIimplUidIndexGranularity; |
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48 TInt iGranStep; |
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49 CActiveScheduler* iScheduler; |
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50 RFs iFs; |
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51 }; |
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52 |
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53 #endif //TE_ECOMGRANULARITYTESTSTEP_H |