/*

* Copyright (c) 2007-2009 Nokia Corporation and/or its subsidiary(-ies).

* All rights reserved.

* This component and the accompanying materials are made available

* under the terms of "Eclipse Public License v1.0"

* which accompanies this distribution, and is available

* at the URL "http://www.eclipse.org/legal/epl-v10.html".

*

* Initial Contributors:

* Nokia Corporation - initial contribution.

*

* Contributors:

*

* Description:

*

*/

#ifndef __TESTS_H__

#define __TESTS_H__

#include "FdfTest.h"

class CTestBase;

struct TTestDefinition

	{

	TTestDefinition(const TDesC8& aDescription, CTestBase* (*aFactoryL)(MTestManager&));

	TBuf8<256> iDescription;

	CTestBase* (*iFactoryL)(MTestManager&);

	};

TTestDefinition::TTestDefinition(const TDesC8& aDescription, CTestBase* (*aFactoryL)(MTestManager&))

	{

	iDescription = aDescription;

	iFactoryL = aFactoryL;

	}

TTestDefinition gTestDefinitions[] = 

	{

		TTestDefinition(_L8("Test 1 (FDF test)"), CFdfTest::NewL),

	};

#endif // __TESTS_H__