/*
* Copyright (c) 2005-2009 Nokia Corporation and/or its subsidiary(-ies).
* All rights reserved.
* This component and the accompanying materials are made available
* under the terms of "Eclipse Public License v1.0"
* which accompanies this distribution, and is available
* at the URL "http://www.eclipse.org/legal/epl-v10.html".
*
* Initial Contributors:
* Nokia Corporation - initial contribution.
*
* Contributors:
*
* Description:
*
*/
/**
@file CTEFUtilitiesUT.cpp
*/
#include "ctefutilitiesut.h"
#include <TEFExportConst.h>
//#include "TestPlatSecSetCapabilities.h"
void CTEFUtilityUT::SetupL()
/**
* SetupL
*/
{
CTestFixture::SetupL();
// iPletSecStep = new CTestPlatSecSetCapabilities();
}
void CTEFUtilityUT::TearDownL()
/**
* TearDownL
*/
{
CTestFixture::TearDownL();
}
void CTEFUtilityUT::TestPlatSec_GetCapability()
{
// iPletSecStep->doTestStepL();
TInt theInt = 10;
//
// TBool res = iConfig.GetInt(_L("Int"),theInt);
// ASSERT_TRUE(res);
ASSERT_TRUE(theInt == 10);
//
// ASSERT_FALSE(theString.Compare(KTestString) );
}
CTestSuite* CTEFUtilityUT::CreateSuiteL(const TDesC& aName)
/**
* CreateSuiteL
*
* @param aName - Suite name
* @return - Suite
*/
{
SUB_SUITE
ADD_TEST_STEP_CLASS( CTEFUtilityUT,TestPlatSec_GetCapability )
END_SUITE
}