--- a/installationservices/swcomponentregistry/test/tscrdatalayer/inc/datalayersteps.h	Tue Aug 31 15:21:33 2010 +0300
+++ /dev/null	Thu Jan 01 00:00:00 1970 +0000
@@ -1,54 +0,0 @@
-/*
-* Copyright (c) 2008-2009 Nokia Corporation and/or its subsidiary(-ies).
-* All rights reserved.
-* This component and the accompanying materials are made available
-* under the terms of the License "Eclipse Public License v1.0"
-* which accompanies this distribution, and is available
-* at the URL "http://www.eclipse.org/legal/epl-v10.html".
-*
-* Initial Contributors:
-* Nokia Corporation - initial contribution.
-*
-* Contributors:
-*
-* Description: 
-* Defines the unit test steps for the SCR Data Layer.
-*
-*/
-
-
-/**
- @file 
- @internalComponent
- @test
-*/
-
-#ifndef TSCRDATALAYER_H
-#define TSCRDATALAYER_H
-
-#include "scrdatabase.h"
-#include "tscrdatalayerserver.h"
-
-#include <scs/oomteststep.h>
-using namespace Usif;
-
-// Constant used to name this test case
-_LIT(KScrDataLayerStep,"SCRDataLayer");
-
-class CScrTestDataLayer : public COomTestStep
-	{
-public:
-	CScrTestDataLayer(CScrDataLayerTestServer& aParent);
-	~CScrTestDataLayer();
-	void ImplTestStepPreambleL();
-	void ImplTestStepL();
-	void ImplTestStepPostambleL();
-	
-private:
-    void InsertRecordL(CStatement& aStmt, TInt aCol1, const TDesC& aCol2, const TDesC& aCol3);
-	void VerifyRecordL(CStatement& aStmt, TInt aCol1, const TDesC& aCol2, const TDesC& aCol3);
-	void ExecuteBadStatementL(CDatabase &aDb, TInt aTestNum, const TDesC& aStatement);
-	void PrintErrorL(const TDesC& aMsg, TInt aErrNum,...);
-	};
-
-#endif /* TSCRDATALAYER_H */