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srcanamdw_os/leavescan/group/testtools_leavescan.history.xml
author Dremov Kirill (Nokia-D-MSW/Tampere) <kirill.dremov@nokia.com>
Tue, 02 Feb 2010 01:39:43 +0200
changeset 0 83f4b4db085c
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Revision: 201005 Kit: 201005
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<?xml version="1.0" encoding="UTF-8"?>
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<relnotes name="LEAVESCAN">
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  <purpose>
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  </purpose>
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    <defect number="DEF116820 " title="Leavescan errors in development code." revision="005">
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    Leavescan errors in development code.
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	</defect>
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	<defect number="PDEF119538 " title="leavescan generates false positives for NONSHARABLE_CLASS macro." revision="004">
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    leavescan generates false positives for NONSHARABLE_CLASS macro.
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	</defect>
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	<defect number="PDEF117080 " title="leavescan.exe terminates abnormally when scanning sources." revision="003">
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    leavescan.exe will crash when run on some source code.
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	</defect>
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    <defect number="PDEF116168 " title="leavescan.exe will crash when run on some source code." revision="002">
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    leavescan.exe will crash when run on some source code.
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  </defect>
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  <defect number="PDEF114881 " title="leavescan cannot handle namespace-qualified return types." revision="001">
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    leavescan cannot handle namespace-qualified return types.
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  </defect>
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 </relnotes>
MCL/sf/os/buildtools