1 // Copyright (c) 2008-2009 Nokia Corporation and/or its subsidiary(-ies).

     2 // All rights reserved.

     3 // This component and the accompanying materials are made available

     4 // under the terms of "Eclipse Public License v1.0"

     5 // which accompanies this distribution, and is available

     6 // at the URL "http://www.eclipse.org/legal/epl-v10.html".

     7 //

     8 // Initial Contributors:

     9 // Nokia Corporation - initial contribution.

    10 //

    11 // Contributors:

    12 //

    13 // Description:

    14 //

    15 

    16 /**

    17  @file

    18  @test

    19  @internalComponent - Internal Symbian test code

    20 */

    21 

    22 #ifndef __SSMCLETESTAPP_H

    23 #define __SSMCLETESTAPP_H

    24 

    25 #include "ssmtestapps.h"

    26 

    27 const TInt KSsmCleTestPanic = 999;

    28 enum TCleTestFailHow

    29 	{

    30 	EDontFail,

    31 	EPanic,

    32 	ENoRendezvous,

    33 	EBadRendezvous,

    34 	EBadPath,

    35 	EMultipleTimeout

    36 	};

    37 

    38 struct TSsmCleTestAppArgs

    39 	{

    40 	TBuf<KTestCommandLineMaxLength> iLogPrefix;

    41 	TInt iWaitTime;

    42 	TInt iSucceedOnRun;

    43 	TCleTestFailHow iFailHow;

    44 	};

    45 

    46 class XSsmCleTestApp

    47 	{

    48 public:

    49 	static void WriteStartTimeL(RFs aFs, const TDesC& aLogPrefix);

    50 	static TInt GetRunCountL(RFs aFs, const TDesC& aLogPrefix);

    51 	static TInt IncrementRunCountL(RFs aFs, const TDesC& aLogPrefix);

    52 	static void GetCommandLineArgsL(TSsmCleTestAppArgs& aArgStruct);

    53 	static void WriteResultL(RFs aFs, const TDesC& aLogPrefix,const TCleTestFailHow& aFailHow);

    54 	};

    55 	

    56 #endif // __SSMCLETESTAPP_H