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1 // Copyright (c) 2007-2009 Nokia Corporation and/or its subsidiary(-ies). |
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2 // All rights reserved. |
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3 // This component and the accompanying materials are made available |
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4 // under the terms of the License "Eclipse Public License v1.0" |
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5 // which accompanies this distribution, and is available |
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6 // at the URL "http://www.eclipse.org/legal/epl-v10.html". |
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7 // |
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8 // Initial Contributors: |
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9 // Nokia Corporation - initial contribution. |
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10 // |
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11 // Contributors: |
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12 // |
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13 // Description: |
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14 // @internalComponent |
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15 // 'A' connector detection |
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16 // |
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17 // |
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18 |
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19 #include <e32std.h> |
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20 #include <e32std_private.h> |
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21 #include <u32std.h> // unicode builds |
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22 #include <e32base.h> |
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23 #include <e32base_private.h> |
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24 #include <e32Test.h> // RTest headder |
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25 #include "testcaseroot.h" |
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26 #include "testcasefactory.h" |
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27 #include "testcase0459.h" |
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28 |
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29 |
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30 |
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31 // the name below is used to add a pointer to our construction method to a pointer MAP in |
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32 // the class factory |
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33 _LIT(KTestCaseId,"PBASE-USB_OTGDI-0459"); |
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34 const TTestCaseFactoryReceipt<CTestCase0459> CTestCase0459::iFactoryReceipt(KTestCaseId); |
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35 |
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36 CTestCase0459* CTestCase0459::NewL(TBool aHost) |
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37 { |
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38 LOG_FUNC |
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39 CTestCase0459* self = new (ELeave) CTestCase0459(aHost); |
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40 CleanupStack::PushL(self); |
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41 self->ConstructL(); |
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42 CleanupStack::Pop(self); |
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43 return self; |
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44 } |
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45 |
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46 |
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47 CTestCase0459::CTestCase0459(TBool aHost) |
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48 : CTestCaseRoot(KTestCaseId, aHost) |
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49 { |
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50 LOG_FUNC |
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51 |
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52 } |
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53 |
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54 |
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55 /** |
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56 ConstructL |
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57 */ |
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58 void CTestCase0459::ConstructL() |
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59 { |
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60 LOG_FUNC |
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61 |
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62 BaseConstructL(); |
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63 } |
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64 |
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65 |
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66 CTestCase0459::~CTestCase0459() |
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67 { |
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68 LOG_FUNC |
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69 |
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70 Cancel(); |
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71 } |
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72 |
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73 |
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74 void CTestCase0459::ExecuteTestCaseL() |
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75 { |
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76 LOG_FUNC |
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77 iCaseStep = EPreconditions; |
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78 |
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79 CActiveScheduler::Add(this); |
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80 SelfComplete(); |
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81 |
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82 } |
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83 |
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84 |
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85 void CTestCase0459::DescribePreconditions() |
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86 { |
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87 test.Printf(_L("Remove 'A' connector beforehand.\n")); |
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88 } |
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89 |
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90 |
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91 void CTestCase0459::DoCancel() |
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92 { |
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93 LOG_FUNC |
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94 |
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95 // cancel our timer |
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96 iTimer.Cancel(); |
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97 } |
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98 |
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99 |
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100 // handle event completion |
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101 void CTestCase0459::RunStepL() |
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102 { |
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103 LOG_FUNC |
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104 // Obtain the completion code for this CActive obj. |
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105 TInt completionCode(iStatus.Int()); |
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106 TBuf<MAX_DSTRLEN> aDescription; |
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107 |
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108 switch(iCaseStep) |
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109 { |
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110 case EPreconditions: |
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111 iCaseStep = ELoadLdd; |
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112 if (iAutomated) |
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113 { |
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114 iCaseStep = ELoadLdd; |
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115 SelfComplete(); |
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116 break; |
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117 } |
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118 // prompt to remove connector |
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119 test.Printf(KRemoveAConnectorPrompt); |
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120 test.Printf(KPressAnyKeyToContinue); |
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121 RequestCharacter(); |
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122 break; |
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123 |
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124 case ELoadLdd: |
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125 if (!StepLoadLDD()) |
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126 { |
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127 break; |
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128 } |
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129 |
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130 iCaseStep = ERegisterForEvents; |
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131 iDequeAttempts = 0; |
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132 SelfComplete(); |
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133 break; |
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134 |
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135 // wait on ID_PIN |
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136 case ERegisterForEvents: |
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137 if (iDequeAttempts > 3) |
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138 { |
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139 return (TestFailed(KErrCorrupt, _L("<Error> too many irrelevant/incorrect events"))); |
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140 } |
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141 |
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142 test.Printf(KInsertAConnectorPrompt); |
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143 iCaseStep = ETestStateA; |
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144 test.Printf(_L("Waiting for OTG Event\n")); |
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145 |
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146 otgQueueOtgEventRequest( iOTGEvent, iStatus); |
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147 |
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148 // start timer |
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149 iIDcheckStart.HomeTime(); |
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150 SetActive(); |
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151 break; |
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152 |
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153 case EDriveID_PIN: |
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154 // please turn on ID_PIN prompt (or programming API call) |
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155 // skipped untill we can do this. |
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156 SetActive(); |
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157 break; |
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158 |
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159 case EWait5: |
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160 case ETestStateA: |
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161 { |
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162 TInt aMillisec; |
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163 OtgEventString(iOTGEvent, aDescription); |
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164 |
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165 iIDcheckEnd.HomeTime(); |
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166 TTimeIntervalMicroSeconds ivlMicro(iIDcheckEnd.MicroSecondsFrom(iIDcheckStart)); |
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167 aMillisec = (TInt)(ivlMicro.Int64())/1000; // USB times are in uSec, but in ms for the user layer |
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168 test.Printf(_L("Received event %d '%S' status(%d) in %d ms"), iOTGEvent, &aDescription, completionCode, aMillisec); |
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169 |
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170 // check the parameters gathered |
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171 if (RUsbOtgDriver::EEventAPlugInserted == iOTGEvent) |
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172 { |
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173 iCaseStep = EUnloadLdd; |
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174 // test if too quick! |
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175 if(aMillisec < KDelayDurationForQEmpty) // use 200ms - clocked at 17ms |
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176 { |
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177 // 'A' was in the receptacle when we started the stack, so it fires immediately, consume it and wait for another. |
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178 test.Printf(_L("Please first remove and then replace the A connector.\n")); |
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179 // wrong event in the Q already, keep at it |
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180 iCaseStep = ERegisterForEvents; |
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181 } |
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182 } |
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183 else |
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184 { |
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185 // wrong event in the Q already, keep at it |
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186 iCaseStep = ERegisterForEvents; |
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187 iDequeAttempts++; |
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188 } |
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189 SelfComplete(); |
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190 } |
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191 break; |
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192 case EUnloadLdd: |
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193 case ELastStep: |
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194 if (EFalse == StepUnloadLDD()) |
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195 { |
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196 return TestFailed(KErrAbort,_L("unload Ldd failure")); |
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197 } |
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198 return TestPassed(); |
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199 |
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200 default: |
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201 test.Printf(_L("<Error> unknown test step")); |
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202 Cancel(); |
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203 return (TestFailed(KErrCorrupt, _L("<Error> unknown test step"))); |
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204 |
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205 } |
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206 |
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207 } |
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208 |
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209 |