kerneltest/e32test/usbho/t_otgdi/src/testcase0459.cpp
changeset 0 a41df078684a
child 43 c1f20ce4abcf
--- /dev/null	Thu Jan 01 00:00:00 1970 +0000
+++ b/kerneltest/e32test/usbho/t_otgdi/src/testcase0459.cpp	Mon Oct 19 15:55:17 2009 +0100
@@ -0,0 +1,209 @@
+// Copyright (c) 2007-2009 Nokia Corporation and/or its subsidiary(-ies).
+// All rights reserved.
+// This component and the accompanying materials are made available
+// under the terms of the License "Eclipse Public License v1.0"
+// which accompanies this distribution, and is available
+// at the URL "http://www.eclipse.org/legal/epl-v10.html".
+//
+// Initial Contributors:
+// Nokia Corporation - initial contribution.
+//
+// Contributors:
+//
+// Description:
+// @internalComponent
+// 'A' connector detection
+// 
+//
+
+#include <e32std.h>
+#include <e32std_private.h>
+#include <u32std.h> 	// unicode builds
+#include <e32base.h>
+#include <e32base_private.h>
+#include <e32Test.h>	// RTest headder
+#include "testcaseroot.h"
+#include "testcasefactory.h"
+#include "testcase0459.h"
+
+
+
+// the name below is used to add a pointer to our construction method to a pointer MAP in 
+// the class factory
+_LIT(KTestCaseId,"PBASE-USB_OTGDI-0459");
+const TTestCaseFactoryReceipt<CTestCase0459> CTestCase0459::iFactoryReceipt(KTestCaseId);	
+
+CTestCase0459* CTestCase0459::NewL(TBool aHost)
+	{
+	LOG_FUNC
+	CTestCase0459* self = new (ELeave) CTestCase0459(aHost);
+	CleanupStack::PushL(self);
+	self->ConstructL();
+	CleanupStack::Pop(self);
+	return self;
+	}
+	
+
+CTestCase0459::CTestCase0459(TBool aHost)
+:	CTestCaseRoot(KTestCaseId, aHost)
+	{
+	LOG_FUNC
+		
+	} 
+
+
+/**
+ ConstructL
+*/
+void CTestCase0459::ConstructL()
+	{
+	LOG_FUNC
+	
+	BaseConstructL();
+	}
+
+
+CTestCase0459::~CTestCase0459()
+	{
+	LOG_FUNC
+
+	Cancel();
+	}
+
+
+void CTestCase0459::ExecuteTestCaseL()
+	{
+	LOG_FUNC
+	iCaseStep = EPreconditions;
+	
+	CActiveScheduler::Add(this);
+	SelfComplete();
+
+	}
+
+
+void CTestCase0459::DescribePreconditions()
+	{
+	test.Printf(_L("Remove 'A' connector beforehand.\n"));
+	}
+
+	
+void CTestCase0459::DoCancel()
+	{
+	LOG_FUNC
+
+	// cancel our timer
+	iTimer.Cancel();
+	}
+	
+
+// handle event completion	
+void CTestCase0459::RunStepL()
+	{
+	LOG_FUNC
+	// Obtain the completion code for this CActive obj.
+	TInt completionCode(iStatus.Int()); 
+	TBuf<MAX_DSTRLEN> aDescription;
+		
+	switch(iCaseStep)
+		{
+		case EPreconditions:
+			iCaseStep = ELoadLdd;
+			if (iAutomated)
+				{
+				iCaseStep = ELoadLdd;
+				SelfComplete();
+				break;
+				}
+			// prompt to remove connector
+			test.Printf(KRemoveAConnectorPrompt);
+			test.Printf(KPressAnyKeyToContinue);
+			RequestCharacter();			
+			break;
+			
+		case ELoadLdd:
+			if (!StepLoadLDD())
+				{
+				break;
+				}
+
+			iCaseStep = ERegisterForEvents;
+			iDequeAttempts = 0;	
+			SelfComplete();
+			break;
+			
+			// wait on ID_PIN
+		case ERegisterForEvents:
+			if (iDequeAttempts > 3)
+				{
+				return (TestFailed(KErrCorrupt, _L("<Error> too many irrelevant/incorrect events")));
+				}
+
+			test.Printf(KInsertAConnectorPrompt);
+			iCaseStep = ETestStateA;
+			test.Printf(_L("Waiting for OTG Event\n"));
+
+			otgQueueOtgEventRequest( iOTGEvent, iStatus);
+
+			// start timer
+			iIDcheckStart.HomeTime();
+			SetActive();
+			break;
+			
+		case EDriveID_PIN:
+			// please turn on ID_PIN prompt (or programming API call)
+			// skipped untill we can do this.
+			SetActive();
+			break;
+			
+		case EWait5:
+		case ETestStateA:
+			{
+			TInt aMillisec;
+			OtgEventString(iOTGEvent, aDescription);
+
+			iIDcheckEnd.HomeTime();
+			TTimeIntervalMicroSeconds ivlMicro(iIDcheckEnd.MicroSecondsFrom(iIDcheckStart));
+			aMillisec = (TInt)(ivlMicro.Int64())/1000;	// USB times are in uSec, but in ms for the user layer
+			test.Printf(_L("Received event %d '%S' status(%d) in %d ms"), iOTGEvent, &aDescription, completionCode, aMillisec);
+			
+			// check the parameters gathered
+			if (RUsbOtgDriver::EEventAPlugInserted == iOTGEvent)
+				{
+				iCaseStep = EUnloadLdd;
+				// test if too quick!
+				if(aMillisec < KDelayDurationForQEmpty) // use 200ms - clocked at 17ms
+					{
+					// 'A' was in the receptacle when we started the stack, so it fires immediately, consume it and wait for another.
+					test.Printf(_L("Please first remove and then replace the A connector.\n"));
+					// wrong event in the Q already, keep at it
+					iCaseStep = ERegisterForEvents;	
+					}
+				}
+			else
+				{
+				// wrong event in the Q already, keep at it
+				iCaseStep = ERegisterForEvents;	
+				iDequeAttempts++;
+				}
+			SelfComplete();
+			}
+			break;		
+		case EUnloadLdd:
+		case ELastStep:
+			if (EFalse == StepUnloadLDD())
+				{
+				return TestFailed(KErrAbort,_L("unload Ldd failure"));	
+				}
+			return TestPassed();
+
+		default:
+			test.Printf(_L("<Error> unknown test step"));
+			Cancel();
+			return (TestFailed(KErrCorrupt, _L("<Error> unknown test step")));
+
+		}
+
+	}
+
+