persistentstorage/centralrepository/test/testexecute/performance/inc/TE_DefectTestStep.h
branchRCL_3
changeset 24 cc28652e0254
parent 0 08ec8eefde2f
equal deleted inserted replaced
23:26645d81f48d 24:cc28652e0254
       
     1 // Copyright (c) 2005-2009 Nokia Corporation and/or its subsidiary(-ies).
       
     2 // All rights reserved.
       
     3 // This component and the accompanying materials are made available
       
     4 // under the terms of "Eclipse Public License v1.0"
       
     5 // which accompanies this distribution, and is available
       
     6 // at the URL "http://www.eclipse.org/legal/epl-v10.html".
       
     7 //
       
     8 // Initial Contributors:
       
     9 // Nokia Corporation - initial contribution.
       
    10 //
       
    11 // Contributors:
       
    12 //
       
    13 // Description:
       
    14 //
       
    15  
       
    16 #ifndef __TE_DEFECTTESTSTEP_H__
       
    17 #define __TE_DEFECTTESTSTEP_H__
       
    18 
       
    19 #include <test/testexecutestepbase.h>
       
    20 
       
    21 _LIT(KPerfTestDefectStepDEF057491, "CentRepDefectTest057491");
       
    22 _LIT(KPerfTestDefectStepDEF059633, "CentRepDefectTest059633");
       
    23 
       
    24 class CPerfTestDefectStep057491 : public CTestStep
       
    25 	{
       
    26 public:
       
    27 	CPerfTestDefectStep057491();
       
    28 	virtual TVerdict doTestStepL(void);
       
    29 	};
       
    30 
       
    31 class CPerfTestDefectStep059633 : public CTestStep
       
    32 	{
       
    33 public:
       
    34 	CPerfTestDefectStep059633();
       
    35 	virtual TVerdict doTestStepL(void);
       
    36 	};
       
    37 
       
    38 #endif // __TE_DEFECTTESTSTEP_H__