persistentstorage/centralrepository/test/testexecute/performance/inc/TE_DefectTestStep.h
// Copyright (c) 2005-2009 Nokia Corporation and/or its subsidiary(-ies).
// All rights reserved.
// This component and the accompanying materials are made available
// under the terms of "Eclipse Public License v1.0"
// which accompanies this distribution, and is available
// at the URL "http://www.eclipse.org/legal/epl-v10.html".
//
// Initial Contributors:
// Nokia Corporation - initial contribution.
//
// Contributors:
//
// Description:
//
#ifndef __TE_DEFECTTESTSTEP_H__
#define __TE_DEFECTTESTSTEP_H__
#include <test/testexecutestepbase.h>
_LIT(KPerfTestDefectStepDEF057491, "CentRepDefectTest057491");
_LIT(KPerfTestDefectStepDEF059633, "CentRepDefectTest059633");
class CPerfTestDefectStep057491 : public CTestStep
{
public:
CPerfTestDefectStep057491();
virtual TVerdict doTestStepL(void);
};
class CPerfTestDefectStep059633 : public CTestStep
{
public:
CPerfTestDefectStep059633();
virtual TVerdict doTestStepL(void);
};
#endif // __TE_DEFECTTESTSTEP_H__