/*

* Copyright (c) 2005-2009 Nokia Corporation and/or its subsidiary(-ies).

* All rights reserved.

* This component and the accompanying materials are made available

* under the terms of "Eclipse Public License v1.0"

* which accompanies this distribution, and is available

* at the URL "http://www.eclipse.org/legal/epl-v10.html".

*

* Initial Contributors:

* Nokia Corporation - initial contribution.

*

* Contributors:

*

* Description: 

*

*/

/**

 @file CTEFUtilitiesUT.cpp

*/

#include "ctefutilitiesut.h"

#include <TEFExportConst.h>

//#include "TestPlatSecSetCapabilities.h"

void CTEFUtilityUT::SetupL()

/**

 * SetupL

 */

	{

	CTestFixture::SetupL();

//	iPletSecStep = new CTestPlatSecSetCapabilities();

	}

void CTEFUtilityUT::TearDownL()

/**

 * TearDownL

 */

	{

	CTestFixture::TearDownL();

	}

void CTEFUtilityUT::TestPlatSec_GetCapability()

	{

//	iPletSecStep->doTestStepL();

	TInt theInt = 10;

//

//	TBool res = iConfig.GetInt(_L("Int"),theInt);

//	ASSERT_TRUE(res);

	ASSERT_TRUE(theInt == 10);

//

//	ASSERT_FALSE(theString.Compare(KTestString) );

	}

CTestSuite* CTEFUtilityUT::CreateSuiteL(const TDesC& aName)

/**

 * CreateSuiteL

 *

 * @param aName - Suite name

 * @return - Suite

 */

	{

	SUB_SUITE

	ADD_TEST_STEP_CLASS( CTEFUtilityUT,TestPlatSec_GetCapability )

	END_SUITE

	}