--- /dev/null Thu Jan 01 00:00:00 1970 +0000
+++ b/sysstatemgmt/systemstatemgr/test/testapps/inc/ssmcletestapp.h Tue Feb 02 00:53:00 2010 +0200
@@ -0,0 +1,56 @@
+// Copyright (c) 2008-2009 Nokia Corporation and/or its subsidiary(-ies).
+// All rights reserved.
+// This component and the accompanying materials are made available
+// under the terms of "Eclipse Public License v1.0"
+// which accompanies this distribution, and is available
+// at the URL "http://www.eclipse.org/legal/epl-v10.html".
+//
+// Initial Contributors:
+// Nokia Corporation - initial contribution.
+//
+// Contributors:
+//
+// Description:
+//
+
+/**
+ @file
+ @test
+ @internalComponent - Internal Symbian test code
+*/
+
+#ifndef __SSMCLETESTAPP_H
+#define __SSMCLETESTAPP_H
+
+#include "ssmtestapps.h"
+
+const TInt KSsmCleTestPanic = 999;
+enum TCleTestFailHow
+ {
+ EDontFail,
+ EPanic,
+ ENoRendezvous,
+ EBadRendezvous,
+ EBadPath,
+ EMultipleTimeout
+ };
+
+struct TSsmCleTestAppArgs
+ {
+ TBuf<KTestCommandLineMaxLength> iLogPrefix;
+ TInt iWaitTime;
+ TInt iSucceedOnRun;
+ TCleTestFailHow iFailHow;
+ };
+
+class XSsmCleTestApp
+ {
+public:
+ static void WriteStartTimeL(RFs aFs, const TDesC& aLogPrefix);
+ static TInt GetRunCountL(RFs aFs, const TDesC& aLogPrefix);
+ static TInt IncrementRunCountL(RFs aFs, const TDesC& aLogPrefix);
+ static void GetCommandLineArgsL(TSsmCleTestAppArgs& aArgStruct);
+ static void WriteResultL(RFs aFs, const TDesC& aLogPrefix,const TCleTestFailHow& aFailHow);
+ };
+
+#endif // __SSMCLETESTAPP_H